Interferometría por corrimiento de fase para caracterizar materiales electro-ópticos

Bibliographic Details
Main Author: Rueda P., J. E.
Corporate Author: e-libro, Corp.
Other Authors: Lasprilla, M. C.
Format: eBook
Language:Spanish
Published: Pamplona, Colombia : Universidad de Pamplona, 2006.
Subjects:
Online Access:https://elibro.net/ereader/uninicaragua/5429

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